Co2Si, CrSi2, ZrSi2, and TiSi2 Formation Studied by a Radioactive 31Si Marker Technique
- Author(s):
- Publication title:
- Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 10
- Pub. Year:
- 1982
- Page(from):
- 129
- Page(to):
- 136
- Pages:
- 8
- Pub. info.:
- New York: North-Holland
- ISSN:
- 02729172
- ISBN:
- 9780444007742 [0444007741]
- Language:
- English
- Call no.:
- M23500/10
- Type:
- Conference Proceedings
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