Analysis of High Resolution Electron Microscope Images of the Pd2Si-Si Interface

Analysis of High Resolution Electron Microscope Images of the Pd2Si-Si Interface

Author(s):: Krakow, W.
Publication title:: Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
Title of ser.:: Materials Research Society symposium proceedings
Ser. no.:: 10
Pub. Year:: 1982
Page(from):: 111
Page(to):: 128
Pages:: 18
Pub. info.:: New York: North-Holland
ISSN:: 02729172
ISBN:: 9780444007742 [0444007741]
Language:: English
Call no.:: M23500/10
Type:: Conference Proceedings

Details

TDL ID:	ZA00015808
Series ID:	PA00000011
Conf. info. (Name):	Materials Research Society annual meeting ; Symposium on thin films and interfaces
Conf. info. (Number):	1981
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1981.11.00

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