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IMAGING OF METAL/SEMICONDUCTOR INTERFACE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY (BEEM)

Author(s):
Publication title:
Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
295
Pub. Year:
1993
Page(from):
231
Page(to):
234
Pages:
4
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991903 [1558991905]
Language:
English
Call no.:
M23500/295
Type:
Conference Proceedings

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