IMAGING VLSI CROSS SECTIONS BY ATOMIC FORCE MICROSCOPY
- Author(s):
- Publication title:
- Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 265
- Pub. Year:
- 1992
- Page(from):
- 283
- Page(to):
- 288
- Pages:
- 6
- Pub. info.:
- Pittsburgh, PA: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991606 [1558991603]
- Language:
- English
- Call no.:
- M23500/265
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
7
Conference Proceedings
Nanocrystal superlattice imaging by atomic force microscopy (Invited Paper)
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
* MEASUREMENT OF MICROMECHANICAL PROPERTIES USING A BIDIRECTIONAL ATOMIC FORCE MICROSCOPE WITH CAPACITATIVE DETECTION
Materials Research Society |
8
Conference Proceedings
Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
9
Conference Proceedings
True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy
MRS - Materials Research Society |
4
Conference Proceedings
Fracture Surface Topography of Energetic Materials Using Atomic-Force Microscopy
MRS - Materials Research Society |
10
Conference Proceedings
An integrated controller for a flexible and wireless atomic force microscopy
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Imaging microtubules in buffer solution using tapping mode atomic force microscopy
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |