Blank Cover Image

IMAGING VLSI CROSS SECTIONS BY ATOMIC FORCE MICROSCOPY

Author(s):
Publication title:
Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
265
Pub. date:
1992
Page(from):
283
Page(to):
288
Pages:
6
Pub. info.:
Pittsburgh, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558991606 [1558991603]
Language:
English
Call no.:
M23500/265
Type:
Conference Proceedings

Similar Items:

Neubauer, Gabi, Cohen, Sidney R., McClelland, Gary M.

Materials Research Society

Stoimenov, P.K., Stoeva, S.I., Prasad, B.L.V., Sorensen, C.M., Klabunde, K.J.

SPIE - The International Society of Optical Engineering

Neubauer, Gabi, Cohen, Sidney R., McClelland, Gary M.

Materials Research Society

Druffner, C.J., Sathish, S.

SPIE-The International Society for Optical Engineering

Whangbo,M.-H., Ren,J., Magonov,S.N., Bengel,H.

Kluwer Academic Publishers

Sugawara, Y., Ueyama, H., Uchihashi, T., Ohta, M., Yanase, Y., Shigematsu, T., Suzuki, M., Morita, S.

MRS - Materials Research Society

Lanzerotti, M. Y. D., Meisel, L. V., Johnson, M. A., Wolfe, A., Thomson, D. J.

MRS - Materials Research Society

Lacort, J., Casanova, R., Brufau, J., Arbat, A., Dieguez, A., Nierlich, M., Steinmetz, O., Puig, M., Samitier, J.

SPIE - The International Society of Optical Engineering

M. Fritz, M. Radmacher, M.W. Allersma, J.P. Cleveland, R.J. Stewart

Society of Photo-optical Instrumentation Engineers

Snitka,V.J., Mizariene,V., Kalinauskas,M., Lucinskas,P.

SPIE-The International Society for Optical Engineering

Pasquier, V., Drake, J. M.

MRS - Materials Research Society

12 Conference Proceedings Noise in atomic force microscopy images

P. S. Timashev, N. A. Aksenova, A. B. Solovieva, S. F. Timashev

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12