Blank Cover Image

THE INFLUENCE OF THERMAL TREATMENT ON DEFECT CHARACTERISTICS IN CZ-SILICON WAFERS INVESTIGAGED BY POSITRON ANNIHILATION SPECTROSCOPY

Author(s):
Publication title:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
262
Pub. Year:
1992
Page(from):
665
Page(to):
670
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991576 [1558991573]
Language:
English
Call no.:
M23500/262
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Defect distribution in large CZ-silicon wafers investigated by positron annihilation spectroscopy

Mascher,P., Puff,W., Hahn,S., Cho,K.H., Lee,B.Y.

Trans Tech Publications
7 Conference Proceedings Positron Annihilation in Electron Irradiated Silicon

Mascher,P., Dannefaer,S., Kerr,D.

Trans Tech Publications
2 Conference Proceedings Defect Distribution Across 6-Inch CZ-Silicon Wafers

Puff,W., Mascher,P., Hahn,S., Cho,K.H., Lee,B.Y.

Trans Tech Publications
8 Conference Proceedings Effects of Boron Doping on the Annealing Characteristics of Cz-Silicon

Puff,W., Mascher,P., Kerr,D., Dannefaer,S.

Trans Tech Publications
3 Conference Proceedings Characterization of Radiation- Induced Defects in ZnO Probed by Positron Annihilation Spectroscopy

Brunner, S., Puff, W., Balogh, Adam G., Mascher, P.

Trans Tech Publications
9 Conference Proceedings ON THE INFLUENCE OF DOPING AND ANNEALING ON OXYGEN-RELATED DEFECTS IN SILICON.

MASCHER,P., DANNEFAER,S., KERR,D., HAHN,S.

Trans Tech Publications
4 Conference Proceedings Defect Identification in (La,Sr)CoO3-ｦﾄ Using Positron Annihilation Spectroscopy

Friessnegg, T., Nielsen, B., Ghosh, V. J., Moodenbaugh, A. R., Madhukar, S., Aggarwal, S., Keeble, D. J., Poindexter, E. …

MRS - Materials Research Society
10 Conference Proceedings A Positron Annihilation Study of Defects in ZnO and Their Relation to Luminescence Centers

Zhong,J., Mascher,P., Puff,W., Kitai,A.H.

Trans Tech Publications
5 Conference Proceedings Defect Characterization of InAs Wafers Using Positron Lifetime Spectroscopy

Mahony, J., Mascher, P.

MRS - Materials Research Society
11 Conference Proceedings Studies of Defects in Electron and Proton Irradiated ZnO by Positron Annihilation

Puff,W., Brunner,S., Mascher,P., Balogh,A.G.

Trans Tech Publications
6 Conference Proceedings HEAT-TREATMENT INDUCED DEFECTS IN CZ-SILICON

Dannefaer, S., Bretagnon, T., Abdurahman, K., Kerr, D., Hahn, S.

Materials Research Society
12 Conference Proceedings DEFECTS IN CZ-SILICON INVESTIGATED BY THE POSITRON ANNIHILATION TEHCNIQUES

Dannefaer, S., Kerr, D.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12