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PRECISION TEM SAMPLE PREPARATION USING FOCUSED ION BEAM MARKING STRATEGIES

Author(s):
Publication title:
Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
254
Pub. Year:
1992
Page(from):
239
Page(to):
248
Pages:
10
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9781558991484 [1558991484]
Language:
English
Call no.:
M23500/254
Type:
Conference Proceedings

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