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*MICROSTRUCTURAL CHARACTERIZATION OF EPITAXIAL BOTTOM ELECTRODES, BUFFER LAYERS, AND FERROELECTRIC THIN FILMS

Author(s):
Rou, S.H.
Graettinger, T.M.
Chow, A.F.
Soble, II, C.N.
Lichtenwalner, D.J.
Auciello, O.
Kingon, A.I.
2 more
Publication title:
Ferroelectric thin films II : symposium held December 2-4, 1991, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
243
Pub. date:
1992
Page(from):
81
Page(to):
92
Pages:
12
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991378 [1558991379]
Language:
English
Call no.:
M23500/243
Type:
Conference Proceedings

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