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STUDY OF DEEP LEVELS IN LT-GaAs MATERIALS AND SI-GaAs WAFERS BY AN IMPROVED THERMOELECTRIC EFFECT SPECTROSCOPY

Author(s):
Publication title:
Low temperature (LT) GaAs and related materials : symposium held December 4-6, 1991, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
241
Pub. Year:
1992
Page(from):
63
Page(to):
68
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991354 [1558991352]
Language:
English
Call no.:
M23500/241
Type:
Conference Proceedings

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