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ANALYTICAL ELECTRON MICROSCOPY AND HIGH-RESOLUTION ELECTRON MICROSCOPY STUDIES OF GRAIN-BOUNDARY FILMS IN SILICON NITRIDE-BASED CERAMICS

Author(s):
Publication title:
Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
238
Pub. Year:
1992
Page(from):
859
Page(to):
864
Pages:
6
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9781558991323 [1558991328]
Language:
English
Call no.:
M23500/238
Type:
Conference Proceedings

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