THE EVOLUTION OF TITANIUM-SILICON INTERFACES AS MONITORED BY X-RAY DIFFRACTION

THE EVOLUTION OF TITANIUM-SILICON INTERFACES AS MONITORED BY X-RAY DIFFRACTION

Author(s):

Publication title:

Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

238

Pub. Year:

1992

Page(from):

581

Page(to):

586

Pages:

6

Pub. info.:

Pittsburgh: Materials Research Society

ISSN:

02729172

ISBN:

9781558991323 [1558991328]

Language:

English

Call no.:

M23500/238

Type:

Conference Proceedings

Details

TDL ID:	ZA00015722
Series ID:	PA00000011
Conf. info. (Name):	Symposium on structure and properties of interfaces in materials
Conf. info. (Number):	1991
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1991.12.02-1991.12.05

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