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STUDY OF THE DEFECT LEVELS AND INTERFACE PROPERTIES OF CdTe AND CdS POLYCRYSTALLINE THIN FILMS

Author(s):
Abou-Elfotouh, F.
Ashour, S.
Alkuhaimi, S. A.
Zhang, J.
Dunlavy, D. J.
Kazmerski, L. L.
1 more
Publication title:
Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
238
Pub. Year:
1992
Page(from):
335
Page(to):
340
Pages:
6
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9781558991323 [1558991328]
Language:
English
Call no.:
M23500/238
Type:
Conference Proceedings

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