Blank Cover Image

THE DETERMINATION OF INTERFACIAL STRUCTURE AND PHASE TRANSITIONS IN Al/Cu AND Al/Ni INTERFACES BY MEANS OF SURFACE EXTENDED X-RAY ABSORPTION FINE STRUCTURE

Author(s):
Publication title:
Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
238
Pub. Year:
1992
Page(from):
211
Page(to):
218
Pages:
8
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9781558991323 [1558991328]
Language:
English
Call no.:
M23500/238
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings FRACTURE-EXAFS: A NEW METHOD FOR THE STUDY OF INTERFACES IN THIN FILMS AND POLYCRYSTALLINE MATERIALS

Barrera, E. V., Maruyama, Benji, Heald, S. M.

Materials Research Society
7 Conference Proceedings NANOLAYER REACTIONS IN ALUMINUM-METAL INTERFACES

Barrera, E.V., Ruckman, M.W., Heald, S.M.

Materials Research Society
2 Conference Proceedings A GRAZING INCIDENCE X-RAY STUDY OF INTERFACIAL REACTIONS IN Al-Cu

Heald, S.M., Chen, H., Tranquada, J.M.

Materials Research Society
8 Conference Proceedings STRUCTURE STUDIES OF THIN AMORPHOUS FILMS BY SYNCHROTRON X-RAY ABSORPTION AND ANALYTICAL ELECTRON MICROSCOPY

Heald, S.M., Tafto, J.

Materials Research Society
3 Conference Proceedings *EXTENDED X-RAY ABSORPTION FINE STRUCTURE STUDIES OF IMPURITIES IN SEMICONDUCTORS

Sette, F., Pearton, S. J., Poate, J. M., Rowe, J. E.

Materials Research Society
9 Conference Proceedings In Situ Surface Extended X-ray Absorption Fine Structure at Chemically Modified Electrodes

Albarelli, M. J., White, J. H., McMillan, M., Bommarito, G. M., Abruna, H. D.

American Chemical Society
4 Conference Proceedings Structural studies of metal-semiconductor interfaces by means of surface extended X-ray absoption edge fine structure (Abstract)

Stohr, J., Jaeger, R., Kendelewicz, T., Rossi, G., :Lindau, I.

North-Holland
10 Conference Proceedings THE CHARACTERIZATION OF THIN FILMS AND LAYERED STRUCTURES USING X-RAY ABSORPTION AND REFLECTION AT GRAZING INCIDENCE

Heald, S. M., Tranquada, J. M., Welch, D. O., Chen, H.

Materials Research Society
5 Conference Proceedings ORIENTATION DEPENDENT X-RAY ABSORPTION NEAR EDGE STRUCTURE IN YBa2Cu3O7 AND La1.85Sr0.15CuO4

Heald, S. M., Tranquada, J. M., Moodenbaugh, A. R., Xu, Y.

Materials Research Society
11 Conference Proceedings SHORT RANGE ORDER STRUCTURES IN Y-Pr-Ba-Cu-O SYSTEM STUDIED BY X-RAY ABSORPTION FINE STRUCTURE (XAFS) TECHNIQUES

Kao, Y.H., Krol, A., Ming, Z.H., Lin, C.S., Soo, Y.L., Gu, C.X., Yang, I.S., Tsuei, C.C.

Materials Research Society
6 Conference Proceedings Extended X-Ray Absorption Fine Structure Studies of InGaN Epilayers

Katchkanov, V., O'Donnell, K. P., Mosselmans, J. F. W., Hernandez, S., Martin, R. W., Nanishi, Y., Kurouchi, M., Watson, …

Materials Research Society
12 Conference Proceedings EXTENDED X-RAY ABSORPTION FINE STRUCTURE STUDIES OF MnZn-FERRITE FILMS

Dorsey, Paul C., Harris, Vincent G., Chrisey, Douglas B., Lubitz, Peter, Horwitz, James S., Koon, Norman C.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12