THE FINITE SIZE EFFECT ON THE METAL-INSULATOR TRANSITION OF VO2 FILMS GROWN BY MOCVD
- Author(s):
Kim, Hyung Kook Chiarello, R. P. You, Hoydoo Chang, M. H. L. Zhang, T. J. Lam, D. J. - Publication title:
- Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 237
- Pub. Year:
- 1992
- Page(from):
- 417
- Page(to):
- 422
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991316 [155899131X]
- Language:
- English
- Call no.:
- M23500/237
- Type:
- Conference Proceedings
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