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THE EFFECT OF DEPOSITION AND ANNEALING CONDITIONS ON THE MICROSTRUCTURE OF Al-Cu AND Al-Cu-Si THIN FILMS

Author(s):
Publication title:
Structure/property relationships for metal/metal interfaces : symposium held April 29-May 1, 1991, Anaheim, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
229
Pub. date:
1990
Page(from):
313
Page(to):
318
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991231 [1558991239]
Language:
English
Call no.:
M23500/229
Type:
Conference Proceedings

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