Blank Cover Image

COMPUTER SIMULATION OF GRAIN GROWTH IN THIN-FILM INTERCONNECT LINES

Author(s):
Publication title:
Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
225
Pub. Year:
1991
Page(from):
219
Page(to):
224
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991194 [1558991190]
Language:
English
Call no.:
M23500/225
Type:
Conference Proceedings

Similar Items:

Frost, H. J., Hayashi, Y., Thompson, C. V., Walton, D. T.

MRS - Materials Research Society

Riege, S. P., Andleigh, V., Thompson, C. V., Frost, H. J.

MRS - Materials Research Society

Frost, H. J., Hayashi, Y., Thompson, C. V., Walton, D. T.

MRS - Materials Research Society

Fayad, W., Andleigh, V., Thompson, C. V., Frost, H. J.

MRS - Materials Research Society

Walton,D.T., Frost,H.J., Thompson,C.V.

Trans Tech Publications

MacDowell, A. A., Chang, C. H., Padmore, H. A., Patel, J. R., Thompson, A, C.

MRS - Materials Research Society

Frost,H.J., Thompson,C.V., Walton,D.T.

Trans Tech Publications

Townsend, S. J., Frost, H. J., Nichols, C. S.

MRS - Materials Research Society

Carel, R., Thompson, C. V., Frost, H. J.

MRS - Materials Research Society

Floro, J. A., Thompson, C. V.

Materials Research Society

Frost, H.J., Thompson, C.V.

Materials Research Society

12 Conference Proceedings Secondary Grain Growth in Thin Films

Thompson, C. V., Smith, Henry I.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12