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THE EXTRACTION OF MINORITY CARRIER LIFETIME FROM THE CURRENT-VOLTAGE CHARACTERISTICS OF Si/Si1-xGex DEVICES

Author(s):
Ghani, T.
Hoyt, J.L.
Noble, D.B.
Gibbons, J.F.
Turner, J.E.
Kamins, T.I.
1 more
Publication title:
Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
220
Pub. Year:
1991
Page(from):
385
Page(to):
390
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991149 [155899114X]
Language:
English
Call no.:
M23500/220
Type:
Conference Proceedings

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