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IMPACT OF X-RAY TOMOGRAPHIC MICROSCOPY ON DEFORMATION STUDIES OF A SiC/Al MMC

Author(s):
Publication title:
Advanced tomographic imaging methods for the analysis of materials : symposium held November 28-30, 1990, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
217
Pub. Year:
1991
Page(from):
135
Page(to):
142
Pages:
8
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991095 [1558991093]
Language:
English
Call no.:
M23500/217
Type:
Conference Proceedings

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