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MICROSTRUCTURES IN Y-Ba-Cu-O THIN FILMS INVESTIGATED BY XAFS TECHNIQUES

Author(s):
Krol, A.
Ming, Z.H.
Lin, C.S.
Soo, Y.L.
Gu, C.X.
Kao, Y.H.
Narumi, E.
Shaw, D.T.
Smith, G.C.
4 more
Publication title:
Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
209
Pub. Year:
1991
Page(from):
873
Page(to):
876
Pages:
4
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991019 [1558991018]
Language:
English
Call no.:
M23500/209
Type:
Conference Proceedings

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