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INTERFACE STRUCTURE OF EPITAXIAL AND Nb FILMS ON SAPPHIRE: GRAZING INCIDENCE X-RAY DIFFRACTION AND X-RAY REFLECTIVITY STUDIES

Author(s):
Publication title:
Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
209
Pub. Year:
1991
Page(from):
679
Page(to):
684
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991019 [1558991018]
Language:
English
Call no.:
M23500/209
Type:
Conference Proceedings

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