Blank Cover Image

POINT DEFECT INJECTION AND ENHANCED Sb DIFFUSION IN Si DURING Co-Si AND Ti-Si REACTIONS

Author(s):
Publication title:
Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
209
Pub. Year:
1991
Page(from):
517
Page(to):
522
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991019 [1558991018]
Language:
English
Call no.:
M23500/209
Type:
Conference Proceedings

Similar Items:

Honeycutt W. J., Rozgonyi A. G.

Kluwer Academic Publishers

Honeycutt, J. W., Ravi, J., Rozgonyi, G. A.

Materials Research Society

Xiao, Z. G., Honeycutt, J. W., Rozgonyi, G.A.

Materials Research Society

Chen, J., Robinson, H.G., Herner, S.B., Jones, K.S.

Electrochemical Society

Jeon, Hyeongtag,, Nemanich, R.J., Honeycutt, J.W., Rozgonyi, G.A.

Materials Research Society

Rozgonyland, George A., Honeycutt, J. W.

Materials Research Society

Xiao, Z.G., Honeycutt, J.W., Rozgonyi, G.A.

Materials Research Society

Cho, C.R., Yarykin, N., Rozgonyi, G.A., Zuhr, R.A.

Electrochemical Society

Jeon, Hyeongtag, Honeycutt, J.W., Sukow, C.A., Rozgonyi, G.A., Nemanich, R.J.

Materials Research Society

Myers, E., Rozgonyi, G.A., Sadana, D.K., Maszara, W., Wortman, J.J., Narayan, J.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12