Blank Cover Image

THE PERFORMANCE OF CHANNEL CUT COLLIMATORS FOR PRECISION X-RAY DIFFRACTION STUDIES OF EPITAXIAL LAYERS

Author(s):
Publication title:
Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
208
Pub. Year:
1991
Page(from):
107
Page(to):
112
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991002 [155899100X]
Language:
English
Call no.:
M23500/208
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings PRINCIPLES AND PERFORMANCE OF A PC-BASED PROGRAM FOR SIMULATION OF DOUBLE-AXIS X-RAY ROCKING CURVES OF THIN EPITAXIAL FILMS

Keith Bowen, D., Loxley, Neil, Tanner, Brian K., Cooke, Lynne, Capano, Michael A.

Materials Research Society
7 Conference Proceedings NEW ALGORITHMS FOR RAPID FULL-WAFER MAPPING BY HIGH RESOLUTION DOUBLE AXIS X-RAY DIFFRACTION

Loxley, N., Cockerton, S., Cooke, L. M., Gray, T., Tanner, B. K., Bowen, D. K.

MRS - Materials Research Society
2 Conference Proceedings APPLICATION OF A DESK-SIDE DOUBLE-AXIS X-RAY DIFFRACTOMETER FOR VERY LARGE AREA EPILAYER CHARACTERIZATION

Loxley, Neil, Keith Bowen, D., Tanner, Brian K.

Materials Research Society
8 Conference Proceedings A GRAZING INCIDENCE X-RAY REFLECTOMETER FOR RAPID NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS AND INTERFACES

Loxley, N., Monteiro, A., Cooke, M. L.., Bowen, D. K., Tanner, B. K.

Materials Research Society
3 Conference Proceedings X-RAY REFLECTOMETRY FROM SEMICONDUCTOR SURFACES AND INTERFACES

Tanner, Brian K., Miles, Simon J., Keith Bowen, D., Hart, Linda, Loxley, Neil

Materials Research Society
9 Conference Proceedings CHARACTERIZATION OF SUB-SURFACE STRUCTURES BY DOUBLE CRYSTAL X-RAY DIFFRACTION

Bowen, D. K., Hill, M. J., Tanner, B. K.

Materials Research Society
4 Conference Proceedings X-RAY DOUBLE CRYSTAL TOPOGRAPHY OF PROCESSED SILICON WAFERS

Loxley, Neil, Tanner, Brian K.

Materials Research Society
10 Conference Proceedings PRINCIPLES AND PERFORMANCE OF A PC-BASED PROGRAM FOR SIMULATION OF GRAZING INCIDENCE X-RAY REFLECTIVITY PROFILES

Wormington, M., Bowen, D. K., Tanner, B. K.

Materials Research Society
5 Conference Proceedings THE CONTRAST OF DISLOCATIONS IN X-RAY TOPOGRAPHS HOMOGENEOUSLY BENT SILICON CRYSTALS

Loxley, Neil, Tanner, Brian K.

Materials Research Society
11 Conference Proceedings Combined Room Temperature Photoluminescence and High Resolution X-ray Diffraction Mapping of Semiconductor Wafers

Cockerton, S., Cooke, M. L., Bowen, D. K., Tanner, B. K.

MRS - Materials Research Society
6 Conference Proceedings High-Resolution X-ray Diffraction from Epitaxial Gallium Nitride Films

Lafford, T., Loxley, N., Tanner, B. K.

MRS - Materials Research Society
12 Conference Proceedings THERMAL DEGRADATION OF SiGe INTERFACES STUDIED BY X-RAY REFLECTIVITY AND DIFFRACTION

Hudson, , J. M., Powell, A. R., Bowen, D. K., Wormington, M., Tanner, B. K., Kubiak, R. A., Parker, E. H. C.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12