Blank Cover Image

IN SITU DIAGNOSTICS OF EPITAXIAL GROWTH USING REFLECTANCE-DIFFERENCE

Author(s):
Publication title:
Chemical perspectives of microelectronic materials II : symposium held November 26-28, 1990, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
204
Pub. date:
1991
Page(from):
47
Page(to):
52
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990968 [1558990968]
Language:
English
Call no.:
M23500/204
Type:
Conference Proceedings

Similar Items:

Lars Samuelson

American Institute of Chemical Engineers

Danielsson, O., Jonsson, S., Henry, A., Janzen, E.

Trans Tech Publications

Paulsson, G., Junno, B., Samuelson, L.

Materials Research Society

Moret, Matthieu, Briot, Olivier, Ruffenach-Clur, Sandra, Aulombard, Roger-Louis

Materials Research Society

Samuelson, Lars, Deppert, Knut, Malm, Jan-Olle

MRS - Materials Research Society

Samuelson, Lars, Gustafsson, Anders, Hessman, Dan, Lindahl, Joakim, Montelius, Lars, Petersson, Anders, Pistol, …

MRS - Materials Research Society

Bhattacharya, A., Haberland, K., Poser, F., Zettler, J.T., Zorn, M., Weyers, M., Richter, W.

SPIE-The International Society for Optical Engineering

Nabuurs Gert-Jan

Springer

Colas, E., Aspnes, D. E., Bhat, R., Studna, A. A., Koza, M. A., Keramidas, V. G.

Materials Research Society

Ott, Adina K., Casey, Sean M., Alstrin, April L., Leone, Stephen R.

MRS - Materials Research Society

Miller, Mark, Jeppesen, Soren, Georgsson, Kristina, Kowalski, Bernhard, Malm, Jan-Olle, Pistol, Mats-Erik, Samuelson, …

MRS - Materials Research Society

Kapre, R. M., Tsang, W. T., Sciortino, P. F., Jr.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12