Blank Cover Image

A Technique for the Preparation of Thin-Film Cross-Sections for Transmission Electron Microscopy

Author(s):
Publication title:
Specimen preparation for transmission electron microscopy of materials--II : symposium held April 19-20, 1990, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
199
Pub. Year:
1990
Page(from):
243
Page(to):
252
Pages:
10
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990883 [1558990887]
Language:
English
Call no.:
M23500/199
Type:
Conference Proceedings

Similar Items:

Karasyov,V.Y., Skornyakov,A.V., Kuznetsov,M.G.

SPIE-The International Society for Optical Engineering

Carter Jr., C. H., Edmond, J. A., Palmour, J. W., Ryu, J., Kim, H. J., Davis, R. F.

Materials Research Society

Mayer, J., Lanham, M., James, T.W., Evans, A.G., Ruhle, M.

Materials Research Society

Libera, M.

MRS - Materials Research Society

Seraphin, Supapan, Zhou, Dan, Teowee, G., Boulton, J. M., Uhlmann, D. R.

MRS - Materials Research Society

Morris, J. C., Pharr, G. M., Callahan, D. L.

Materials Research Society

Chen, J-P., Nastasi, M., Jervis, T.R., Tesmer, J.R., Zocco, T.G.

Materials Research Society

H.R. Moutinho, R.G. Dhere, C.-S. Jiang, M.M. Al-Jassim

Materials Research Society

Kuroda, K., Tsuji, S., Hayashi, Y., Saka, H.

MRS - Materials Research Society

Shapur, F, Park, M.

Materials Research Society

Csencsits,R., Gruen,D.M., Krauss,A.R., Zuiker,C.D.

SPIE-The International Society for Optical Engineering

Hosson, J. T. M. De, Raedt, H. A. De

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12