Blank Cover Image

* MEASUREMENT OF MICROMECHANICAL PROPERTIES USING A BIDIRECTIONAL ATOMIC FORCE MICROSCOPE WITH CAPACITATIVE DETECTION

Author(s):
Publication title:
Interfaces between polymers, metals, and ceramics : symposium held April 25-27, 1989, San Diego, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
153
Pub. Year:
1989
Page(from):
307
Page(to):
316
Pages:
10
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990265 [1558990267]
Language:
English
Call no.:
M23500/153
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

Neubauer, Gabi, Cohen, Sidney R., McClelland, Gary M.

Materials Research Society
7 Conference Proceedings "Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitrde Tips"

Moers P. H. M., Tack G. R., Noordman J. F. O., Segerink B. F., van Hulst F. N., Bolger B.

Kluwer Academic Publishers
2 Conference Proceedings IMAGING VLSI CROSS SECTIONS BY ATOMIC FORCE MICROSCOPY

Neubauer, Gabi, Lawrence, M., Dass, A., Johnson, Thad J.

Materials Research Society
8 Conference Proceedings Preisach model for quantifying hysteresis in an atomic force microscope

Smith, R.C., Salapaka, M.V., Cherveny, L.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings A study of cavitation phenomena using an atomic force microscope

Barrow, M.S., Bowen, W.R., Hilal, N., Al-Hussany, A., Williams, P.R., Williams, R.L., Wright, C.

Kluwer Academic Publishers
9 Conference Proceedings Fast simulation of atomic-force-microscope imaging of atomic and polygonal surfaces using graphics hardware

Varadhan, G., Robinett, W., Erie, D., Taylor ll, R.M.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings ATOMIC FORCE MICROSCOPE DESIGNS AND APPLICATIONS

Bryant, P.J., Miller, R.G., Deeken, R.H., Pederson, M.A.

Materials Research Society
10 Conference Proceedings Atomic Force Microscope-Based Lithography of Titanium

Gordon, A. E., Litfin, D. D., Hagedorn, M. S., Chen, J., Fayfield, R. T., Higman, T. K.

MRS - Materials Research Society
5 Conference Proceedings NANOIDENTATION ON CONTAMINATION-FREE GOLD FILMS USING THE ATOMIC FORCE MICROSCOPE

Schaefer, D. M., Reifenberger, R.

MRS - Materials Research Society
11 Conference Proceedings IMAGING SINGLE NACREOUS TABLETS WITH THE ATOMIC FORCE MICROSCOPE

Giles, R., Manne, S., Zaremba, C. M., Belcher, A., Mann, S., Morse, D. E., Stucky, G. D., Hansma, P. K.

MRS - Materials Research Society
6 Conference Proceedings Nanomechanics of Peeling Studied Using the Atomic Force Microscope

Mark C. Strus, Arvind Raman, Luis Zalamea, R. Byron Pipes, Cattien V. Nguyen

American Society of Mechanical Engineers
12 Conference Proceedings Pattern measurements of reticles with optical proximity correction assist features using the atomic force microscope

Kuo-Jen Chao, Robert J. Plano, Jeffrey R. Kingsley, J. Fung Chen, Roger F. Caldwell

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12