Blank Cover Image

RELIABILITY OF OHMIC CONTACTS FOR AlGaAs/GaAs HBTs

Author(s):
Jackson, G. S.
Tong, E.
Saledas, P.
Kazior, T. E.
Sprague, R.
Brooks, R. C.
Hsieh, K. C.
2 more
Publication title:
Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
184
Pub. Year:
1990
Page(from):
225
Page(to):
230
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990739 [1558990739]
Language:
English
Call no.:
M23500/184
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings RELIABILITY OF OHMIC CONTACTS FOR AlGaAs/GaAs HBTs

Jackson, G. S., Tong, E., Saledas, P., Kazior, T. E., Sprague, R., Brooks, R. C., Hsieh, K. C.

Materials Research Society
7 Conference Proceedings Investigation of Ohmic Contact Corrosion in GaAs HBT Fabrication

H. Shen, L. Luu-Henderson, S. O'Neil, S. Tiku, R. Ramanathan

Electrochemical Society
2 Conference Proceedings Pd-Ge-Au OHMIC CONTACTS TO GaAs: RELIABILITY AND FAILURE ANALYSIS

Kazior, T. E., Hieslmair, H., Brooks, R. C.

Materials Research Society
8 Conference Proceedings Thermal Behavior of Ohmic Contacts for GaInP/GaAs HBTs

Cassette, S., Delage, S.L., Blanck, H., Chartier, E., Florid, D., DiForte-Poisson, M.A., Chevalier, S., Furlan, G.S.

Electrochemical Society
3 Conference Proceedings Pd-Ge-Au OHMIC CONTACTS TO GaAs: RELIABILITY AND FAILURE ANALYSIS

Kazior, T. E., Hieslmair, H., Brooks, R. C.

Materials Research Society
9 Conference Proceedings p-Ohmic Contact Study for Intra-Cavity Contacts in AlGaAs/GaAs VCSELs

Luo, B., Dang, G., Zhang, A.-P., Ren, F., Lopata, J., Chu, S.N.G., Hobson, W.S, Pearton, S.J.

Electrochemical Society
4 Conference Proceedings HIGHLY RELIABLE WGe OHMIC CONTACT TO GaAs-AlGaAs HBTs

Fullowan, T.R., Ren, F., Tseng, B., Pearton, S.J., Abernathy, C.R., Harriott, L.R., Lane, E.

Materials Research Society
10 Conference Proceedings THE EFFECT OF RAPID THERMAL ANNEALING ON THE ELECTRICAL AND MATERIAL CHARACTERISTICS OF PLANAR DOPED AND UNIFORMLY DOPED GaAs/AlGaAs/InGaAs PSEUDOMORPHIC HEMT …

Kazior, T. E., Brierlev, S. K.

Materials Research Society
5 Conference Proceedings RADIATION TESTING OF AlInAs/InGaAs AND GaAs/AlGaAs HBTs

Witmer, S. B., Mittleman, S., Lehy, D., Ren, F., Fullowan, T. R., Kopf, R. F., Abernathy, C. R., Pearton, S. J., …

Materials Research Society
11 Conference Proceedings In-BASED OHMIC CONTACTS TO THE BASE LAYER OF GaAs-AlGaAs HETEROJUNCTION BIPOLAR TRANSISTORS

Ren, F., Pearton, S. J., Hobson, W. S., Fullowan, T. R., Emerson, A. B., Yanof, A. W., Schleich, D. M.

Materials Research Society
6 Conference Proceedings REACTIVE ION BEAM ASSISTED EVAPORATION OF TIN FILMS FOR USE AS DIFFUSION BARRIERS IN GaAs MMICs

Kazior, T. E., Brooks, R. C.

Materials Research Society
12 Conference Proceedings DC and Microwave Characteristics of 100 V GaAs/AlGaAs HBTs

Baca, A.G., Chang, P.C., Klem, J.F., Ashby, C.I.H., Martin, D.C.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12