Blank Cover Image

ATOMIC STRUCTURE OF Ag/Ni INTERFACES

Author(s):
Publication title:
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
183
Pub. Year:
1990
Page(from):
39
Page(to):
44
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990722 [1558990720]
Language:
English
Call no.:
M23500/183
Type:
Conference Proceedings

Similar Items:

Gao, Y., Merkle, K. L.

Materials Research Society

Merkle, Karl L., Smith, David J.

Materials Research Society

Jang,H., Seidman,D.N., Merkle,K.L.

Trans Tech Publications

Merkle,K.L., Wolf,D.

Trans Tech Publications

Merkle, Karl L.

Materials Research Society

Gao, Y., Bai, G., Merkle, K. L., Chang, H. L. M., Lam, D. J.

MRS - Materials Research Society

Buckett, M.I., Shaffer, J.P., Merkle, Karl L.

Materials Research Society

Merkle, K. L., Wolf, D.

Materials Research Society

Jang,H., Seidman,D.N., Merkle,K.L.

Trans Tech Publications

Chambers, S. A., Gao, Y., Thevuthasan, S., Wen, S., Merkle, K. L., Shivaparan, N., Smith, R. J.

MRS - Materials Research Society

Gao, Y., Merkle, K. L., Chang, H. L. M., Zhang, T. J., Lam, D. J.

Materials Research Society

Gao, Y., Merkle, K.L., Chang, H.L.M., Zhang, T.J., Lam, D.J.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12