Blank Cover Image

RELIABILITY OF OHMIC CONTACTS FOR AlGaAs/GaAs HBTs

Author(s):
Jackson, G. S.
Tong, E.
Saledas, P.
Kazior, T. E.
Sprague, R.
Brooks, R. C.
Hsieh, K. C.
2 more
Publication title:
Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
181
Pub. date:
1990
Page(from):
289
Page(to):
294
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990708 [1558990704]
Language:
English
Call no.:
M23500/181
Type:
Conference Proceedings

Similar Items:

Jackson, G. S., Tong, E., Saledas, P., Kazior, T. E., Sprague, R., Brooks, R. C., Hsieh, K. C.

Materials Research Society

H. Shen, L. Luu-Henderson, S. O'Neil, S. Tiku, R. Ramanathan

Electrochemical Society

Kazior, T. E., Hieslmair, H., Brooks, R. C.

Materials Research Society

Cassette, S., Delage, S.L., Blanck, H., Chartier, E., Florid, D., DiForte-Poisson, M.A., Chevalier, S., Furlan, G.S.

Electrochemical Society

Kazior, T. E., Hieslmair, H., Brooks, R. C.

Materials Research Society

Luo, B., Dang, G., Zhang, A.-P., Ren, F., Lopata, J., Chu, S.N.G., Hobson, W.S, Pearton, S.J.

Electrochemical Society

Fullowan, T.R., Ren, F., Tseng, B., Pearton, S.J., Abernathy, C.R., Harriott, L.R., Lane, E.

Materials Research Society

Witmer, S. B., Mittleman, S., Lehy, D., Ren, F., Fullowan, T. R., Kopf, R. F., Abernathy, C. R., Pearton, S. J., …

Materials Research Society

Ren, F., Pearton, S. J., Hobson, W. S., Fullowan, T. R., Emerson, A. B., Yanof, A. W., Schleich, D. M.

Materials Research Society

Kazior, T. E., Brooks, R. C.

Materials Research Society

Baca, A.G., Chang, P.C., Klem, J.F., Ashby, C.I.H., Martin, D.C.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12