ANNEALING OF ION IMPLANTED TIN IN SILICON: A RBS/CHANNELING, MOSSBAUER SPECTROSCOPY AND TEM INVESTGAGION OF SOLUBILITY AND RESIDUAL DEFECTS
- Author(s):
- Publication title:
- Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 163
- Pub. Year:
- 1990
- Page(from):
- 585
- Page(to):
- 590
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990517 [1558990518]
- Language:
- English
- Call no.:
- M23500/163
- Type:
- Conference Proceedings
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