*HIGH PERFORMANCE PHOTOLUMINESCENCE SPECTROSCOPY USING FOURIER TRANSFORM INTERFEROMETRY

*HIGH PERFORMANCE PHOTOLUMINESCENCE SPECTROSCOPY USING FOURIER TRANSFORM INTERFEROMETRY

Author(s):

Publication title:

Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

163

Pub. Year:

1990

Page(from):

221

Page(to):

232

Pages:

12

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990517 [1558990518]

Language:

English

Call no.:

M23500/163

Type:

Conference Proceedings

Details

TDL ID:	ZA00015647
Series ID:	PA00000011
Conf. info. (Name):	Symposium on impurities, defects, and diffusion in semiconductors
Conf. info. (Number):	1989
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1989.11.27-1989.12.01

Similar Items:

1 Conference Proceedings Uniaxial stress and Zeeman splitting studies of EL2-related photoluminescence in GaAs Nissen,M.K., Villemaire,A., Thewalt,M.L.W. Trans Tech Publications	7 Conference Proceedings Data processing pipeline for a time-sampled imaging Fourier transform spectrometer Naylor, D.A., Fulton, T.R., Davis, P.W., Chapman, M.I., Gom, B.G., Spencer, L.D., Lindner, J.V., Nelson-Fitzpatrick, … SPIE - The International Society of Optical Engineering
2 Conference Proceedings CHARACTERIZATION OF ULTRA HIGH SILICON EPITAXY USING PHOTOLUMINESCENCE SPECTROSCOPY Huffman, J. E., Thewalt, M. L. W., Steele, A. G. Materials Research Society	8 Conference Proceedings Performance verification of the Geosynchronous Imaging Fourier Transform Spectrometer (GIFTS) on-board blackbody calibration system F. A. Best, H. E. Revercomb, D. C. Tobin, R. O. Knuteson, J. K. Taylor, D. J. Thielman, D. P. Adler, M. W. Werner, S. D. … SPIE - The International Society of Optical Engineering
3 Conference Proceedings PHOTOLUMINESCENCE OF THIN Si1-XGeX QUANTUM WELLS Lenchyshyn, L.C., Thewalt, M.L.W., Houghton, D.C., Noel, J.-P., Rowell, N.L., Sturm, J.C., Xiao, X. Materials Research Society	9 Conference Proceedings Geosynchronous Imaging Fourier Transform Spectrometer (GIFTS) Engineering Demonstration Unit (EDU) overview and performance summary G. E. Bingham, R. E. Anderson, G. W. Cantwell, D. K. Zhou, D. K. Scott, R. W. Esplin, G. B. Hansen, S. M. Jensen, M. D. … SPIE - The International Society of Optical Engineering
4 Conference Proceedings VISIBLE PHOTOLUMINESCENCE FROM Si1-XGeX QUANTUM WELLS Steiner, T.W., Lenchyshyn, L.C., Thewalt, M.L.W., Houghton, D.C., Noel, J.-P., Rowell, N.L., Sturm, J.C., Xiao, X. Materials Research Society	10 Conference Proceedings GROWTH AND PHOTOLUMINESCENCE OF STRAINED <110> Si/Si1-xGex/Si QUANTUM WELLS GROWN BY RAPID THERMAL CHEMICAL VAPOR DEPOSITION Liu, C. W., Sturm, J. C., Lacroix, Y. R. J., Thewalt, M. L. W., Perovic, D. D. MRS - Materials Research Society
5 Conference Proceedings Characterization of Silicon Carbide Nanowhiskers Synthesized by Microwave Heating Using Photoluminescence Spectroscopy and Fourier Transform Infrared … S.M. Kahar, C.H. Voon, C.C. Lee, K.L. Foo, B.Y. Lim Trans Tech Publications	11 Conference Proceedings TEMPERATURE DEPENDENT AND TIME RESOLVED OPTICVAL STUDIES OF SINGLE QUANTUM WELLS PRODUCED BY INTERRUPTED GROWTH MBE Elman, B.S., Koteles, Emil S., Jagannath, C., Chen, Y.J., Charbonneau, S., Thewalt, M.L.W. Materials Research Society
6 Conference Proceedings WELL-RESOLVED BAND-EDGE PHOTOLUMINESCENCE FROM STRAINED Si1-xGex LAYERS GROWN BY RAPID THERMAL CHEMICAL VAPOR DEPOSITION Sturm, J.C., Schwartz, P.V., Manoharan, H., Mi, Q., Lenchyshyn, L.C., Thewalt, M.L.W., Rowell. N.L., Noel, J.-P., … Materials Research Society	12 Conference Proceedings Ultra-hrgh resolution photoluminescence studles of bound excitons and multi-bound exciton complexes in silicon Thewalt,MLW, Brake,DM Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12