Blank Cover Image

PHOTOLUMINESCENCE EXCITATION SPECTROSCOPY OF MOCVD-GROWN: GaAs:V

Author(s):
Publication title:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
163
Pub. date:
1990
Page(from):
63
Page(to):
68
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990517 [1558990518]
Language:
English
Call no.:
M23500/163
Type:
Conference Proceedings

Similar Items:

Hobson, W. S., Pearton, S. J., Swaminathan, V., Jordan, A. S., Kao, Y. J., Haegel, M., Kanber, H.

Materials Research Society

Mazzi, V. P., Haegel, N. M., Vernon, S. M., Haven, V,. E,.

Materials Research Society

2 Conference Proceedings Erbium Doped GaAs by MOCVD

Greenwald, A. C., Linden, K. J., Rees, W. S., Jr., Just, O., Haegel, N. M., Donder, S.

MRS - Materials Research Society

Hobson, W.S., Pearton, S.J., Short, K.T., Jones, K.S., Vernon, S.M., Jacobson, D.C., Abernathy, C.R., Caruso, R.

Materials Research Society

Swaminathan, V., Chakrabarti, U.K., Hobson, W.S., Caruso, R., Lopata, J., Pearton, S.J.

Materials Research Society

Zemon, S., Jagannath, C., Shastry, S.K., Miniscalco, W.J., Lambert, G.

Materials Research Society

Schnoes, Lamoni M., Harris, T. D., Hobson, W. S., Lum., R. M., Klingent, J. K.

Materials Research Society

Pearton, S.J., Hobson, W.S., Von Neida, A.E., Haegel, N.M., Jones, K.S., Morris, N., Sealy, B.J.

Materials Research Society

Wang, Lei, Wilson, M.T., Goorsky, M.S., Haegel, N.M.

Materials Research Society

N.K. Dutta, W.S. Hobson, J. Lopata, E.F. Schubert, M. Passlack

Society of Photo-optical Instrumentation Engineers

Pearton, S.J., Jones, K.S., Chakabarti, U.K., Emerson, B., Lane, E., Vasile, M.J., Fullowan, T.R., Hobson, W.S., Short, …

Materials Research Society

Hobson, W.S.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12