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THICKNESS MEASUREMENT OF THIN FILMS BY X-RAY ABSORPTION

Author(s):
Publication title:
Properties of II-VI semiconductors : bulk crystals, epitaxial films, quantum well structures, and dilute magnetic systems : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
161
Pub. Year:
1990
Page(from):
83
Page(to):
90
Pages:
8
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990494 [1558990496]
Language:
English
Call no.:
M23500/161
Type:
Conference Proceedings

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