Blank Cover Image

NONDESTRUCTIVE COMPOSITIONAL AND DEFECT CHARACTERIZATION OF CdZnTe ALLOYS USING PHOTOLUMINESCENCE SPECTROSCOPY

Author(s):
Publication title:
Properties of II-VI semiconductors : bulk crystals, epitaxial films, quantum well structures, and dilute magnetic systems : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
161
Pub. Year:
1990
Page(from):
39
Page(to):
44
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990494 [1558990496]
Language:
English
Call no.:
M23500/161
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Characterization of the HEFT CdZnTe pixel detectors

Chen, C. M. H., Cook, W. R., Harrison, F. A., Lin, J. Y. Y., Mao, P. H., Schindler, S. M.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Tellurium antisites in CdZnTe

Chu,M., Terterian,S., Ting,D., James,R.B., Erickson,J.C., Yao,H.W., Lam,T.T., Szawlowski,M., Szczebiot,R.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings *MBR GROWTH AND CHARACTERIZATION OF HgCdTe HERETOSTRUCTURES

Koestner, R. J., Goodwin, M. W., Schaake, H. F.

Materials Research Society
8 Conference Proceedings Characterization of Pd Impurities and Finite-Sized Defects in Detector Grade CdZnTe

M.C. Duff, J.P. Bradley, Z.R. Dai, N. Teslich, A. Burger, M. Groza, V. Buliga

Materials Research Society
3 Conference Proceedings MICROSTRUCTURAL CHARACTERIZATION OF GaAs SUBSTRATES

Moore, T.M., Matteson, S., Duncan, W.M., Matyi, R.J.

Materials Research Society
9 Conference Proceedings Effects of Composition on Solidification Microstructure of Cast Titanium Alloys

P.N. Andrade, A.A. Coelho, C.R.M. Afonso, R.J. Contieri, M.H. Robert

Trans Tech Publications
4 Conference Proceedings POURIER TRANSFORM PHOTOLUMINESCENCE ANALYSIS OF TRACE IMPURITIES AND DEFECTS IN SILICON

Duncan, W.M., Eastwood, M.L.

Materials Research Society
10 Conference Proceedings Characterization of Long-Term Oxidized Nickel Aluminide Coating by Photoluminescence Spectroscopy

Byeon, J. W., Mu, N., Liu, J., Sohn, Y. H.

Trans Tech Publications
5 Conference Proceedings CHARACTERIZATION OF ATOMIC DEFECTS AND THEIR AGGREGATES USING POSITION ANNHILATION SPECTROSCOPY

Siegel, R. W., Fluss, M. J., Smedskjaer, L. C.

Materials Research Society
11 Conference Proceedings Use of a Capillary X-ray Focused Beam to Investigate the Chemical Composition of CdZnTe Wafers With High-Resolution CdZnTe Detectors

Fougeres, P., Burggraf, Ch, Burggraf, Chr, Koebel, J. M., Koenig, C., Regal, R., Hage-Ali, M., Krauth, A., Siffert, P.

MRS - Materials Research Society
6 Conference Proceedings Composition and performance mapping of CdZnTe nuclear spectrometers

Toney,J.E., Brunett,B.A., Schlesinger,T.E., Yoon,H., Scyoc,J.M.Van, Antolak,A.J., Morse,D.H., Eissler,E.E., …

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Sub-dekahertz spectroscopy of 199Hg+

Bergquist,J.C., Rafac,R.J., Young,B.C., Beall,J.A., Itano,W.M., Wineland,D.J.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12