PHOTOEMISSION STUDY OF Si(001) SURFACES EXPOSED TO As FLUX
- Author(s):
Okumura, H. Miki, K. Sakamoto, K. Sakamoto, T. Misawa, S. Endo, K. Yoshita, S. - Publication title:
- Chemistry and defects in semiconductor heterostructures
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 148
- Pub. Year:
- 1989
- Page(from):
- 285
- Page(to):
- 290
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990210 [1558990216]
- Language:
- English
- Call no.:
- M23500/148
- Type:
- Conference Proceedings
Similar Items:
Plenum Press |
Trans Tech Publications |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Anisotropic etching of dielectrics exposed by high intensity femtosecond pulses
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
PHOTOEMISSION STUDY OF THE PHYSICAL NATURE OF THE InP NEAR-SURFACE DEFECT STATES
Materials Research Society |
4
Conference Proceedings
*DIGITAL CHEMICAL VAPOR DEPOSITION OF SILICON OXIDE-NITRIDE AND ITS SURFACE REACTION STUDY
Materials Research Society |
10
Conference Proceedings
The APD Annihilation Mechanism of 3C-SiC Hetero-Epilayer on Si(001) Substrate
Trans Tech Publications |
5
Conference Proceedings
An Angular Dependent X-ray Photoemission Study of Indium-Tin-Oxide Surfaces
Materials Research Society |
Trans Tech Publications |
Materials Research Society |
12
Conference Proceedings
Nitridation of GaAs (001)-2x4 Surface Studied by Auger Electron Spectroscopy
MRS - Materials Research Society |