SCANNING TUNNELING MICROSCOPY OF THE CLEAVED SURFACES OF Bi-CONTAINING SUPERCONDUCTORS

SCANNING TUNNELING MICROSCOPY OF THE CLEAVED SURFACES OF Bi-CONTAINING SUPERCONDUCTORS

Author(s):

Publication title:

High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

139

Pub. Year:

1989

Page(from):

169

Page(to):

174

Pages:

6

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990128 [1558990127]

Language:

English

Call no.:

M23500/139

Type:

Conference Proceedings

Details

TDL ID:	ZA00015624
Series ID:	PA00000011
Conf. info. (Name):	Symposium on high resolution microscopy of materials
Conf. info. (Number):	1988
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1988.11.29-1988.12.01

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