RECONSTRUCTION OF (100) SILICON/DISILICIDE INTERFACES
- Author(s):
Loretto, D. Gibson, J.M. White, Alice E. Short, K.T. Tung, R.T. Yalisove, S.M. Batstone, J.L. - Publication title:
- High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 139
- Pub. Year:
- 1989
- Page(from):
- 97
- Page(to):
- 102
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990128 [1558990127]
- Language:
- English
- Call no.:
- M23500/139
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
7
Conference Proceedings
THE ROLE OF IMPLANT TEMPERATURE IN THE FORMATION OF THIN BURIED OXIDE LAYERS
Materials Research Society |
Materials Research Society |
8
Conference Proceedings
ELECTRON BEAM INDUCED CURRENT STUDIES OF NICKEL SILICIDE/SILICON SCHOTTKY BARRIER HEIGHTS
Materials Research Society |
3
Conference Proceedings
A UHV TEM STUDY OF THE IN-SITU GROWTH OF ULTRA-THIN FILMS OF CoSi2 on Si (100)
Materials Research Society |
9
Conference Proceedings
*CORRELATION OF ELECTRICAL PROPERTIES WITH STRUCTURE IMAGING OF SEMICONDUCTOR INTERFACES
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
11
Conference Proceedings
IN-SITU STUDIES OF THE MBE GROWTH OF GoSi2 ON Si (111) IN A UHV TRANSMISSION ELECTRON MICROSCOPE
Materials Research Society |
Materials Research Society |
Materials Research Society |