DEFECT STRUCTURE ANALYSIS OF THICK EPITAXIAL FILMS WITH VERY LARGE LATTICE MISMATCH: Ag/Si(111) AND Ag/Si (001)
- Author(s):
Park, K.-H. Smith, G.A. McKenna, D.C. Luo, L. Jin, H.-S. Gibson, W.M. Rajan, K. Lu, T.-M. Wang, G.-C. - Publication title:
- Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 138
- Pub. Year:
- 1989
- Page(from):
- 545
- Page(to):
- 550
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990111 [1558990119]
- Language:
- English
- Call no.:
- M23500/138
- Type:
- Conference Proceedings
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