Blank Cover Image

X-RAY DIFFRACTION DETERMINATION OF STRESSES IN THIN FILMS

Author(s):
Publication title:
Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
130
Pub. date:
1989
Page(from):
3
Page(to):
12
Pages:
10
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990036 [1558990038]
Language:
English
Call no.:
M23500/130
Type:
Conference Proceedings

Similar Items:

Hamdi, A. H., Tandon, J. L., Vreeland Jr., T., Nicolet, M. A.

Materials Research Society

Livi, R. P., Paine, S., Wie, C. R., Mendenhall, M. H., Tang, J. Y., Vreeland Jr., T., Tombrello, T. A.

Materials Research Society

Bai, Gang, Nicolet, Marc.-A., Vreeland, Jr. Thad, Ye, Q., Kao, Y.C., Wang, K.L.

Materials Research Society

Radler, M. J., Crowder, C. E., Shaffer, E. O, Townsend, P. H.

Materials Research Society

Wie, C. R., Choi, Y. W., Kim,. H. M, Chen, J. F., Vreeland Jr., T., Tsai, C.-J

Materials Research Society

So, F.C.T., Zhao, X.-A., Kolawa, E., Tandon, J.L., Zhu, M.F., Nicolet, M.-A.

Materials Research Society

Bai, G., Jamieson, D. N., Nicolet, M-A., Vreeland Jr., T.

Materials Research Society

Martyniuk, M.P., Antoszewski, J., Musca, C.A., Dell, J.M., Faraone, L.

SPIE - The International Society of Optical Engineering

Tsai, C.J., Atwater, H.A., Vreeland, T.

Materials Research Society

Pottiger T. M., Soburn C. J.

Society of Plastics Engineers, Inc. (SPE)

Xiong, Fulin, Tsai, C.J., Vreeland, Jr., T., Tombrello, T.A.

Materials Research Society

Rigden, J.S., Burke, T.M., Newport, R.J.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12