Blank Cover Image

*ION BEAM PROCESSING OF OPTICAL MATERIALS

Author(s):
Williams, F.L.
Boyer, L.L.
Reicher, D.W.
McNally, J.J.
Al-Jumaily, G.A.
McNeil, J.R.
1 more
Publication title:
Processing and characterization of materials using ion beams : symposium held November 28-December 2, 1988, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
128
Pub. Year:
1989
Page(from):
483
Page(to):
494
Pages:
12
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990012 [1558990011]
Language:
English
Call no.:
M23500/128
Type:
Conference Proceedings

Similar Items:

Williams, F.L., Boyer, L.L., Reicher, D.W., McNally, J.J., Al-Jumaily, G.A., McNeil, J.R.

Materials Research Society

Bone, D.J., Lee, H., Williams, K., Harris, J.S., Jr., Pease, R. F. W.

Electrochemical Society

Al-Jumaily, G. A., McNally, J, J,., McNeil, J. R.

Materials Research Society

8 Conference Proceedings Ion Beam Deposited GMR Materials

Lannon, J.M. jr.,, Pace, C.C., Temple, D., McGuire, G.E, Hebard, A.F., Ray, M.

Materials Research Society

Boyer, LL., Wu, A.Y., McNeil, J.R.

Materials Research Society

Elliman, R.G., Williams, J.S., Maher, D.M., Brown, W.L.

Materials Research Society

AL-JUMAILY,G.A., McNEIL,R., BENDOW,B., MARTIN,D.

Trans Tech Publications

Besson,R.J., Boy,J.J., Guzzo,P.L., Mansfeld,G.D.

SPIE-The International Society for Optical Engineering

Petersen, G.A., Zou, L.C., Van Buren, W.M., Boyer, L.L., McNeil, J.R.

Materials Research Society

Williams,F.L., Ehlert,J.C., Wickholm,D.R.

SPIE-The International Society for Optical Engineering

Williams, J. S., Brown, W. L., Elliman, R. G., Knoell, R. V., Maher, D. M., Seidel, T. E.

Materials Research Society

Williams, J. S., Elliman,. R. G, Johnson, S. T., Sengupta, D. K., Zemanski, J. M

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12