Blank Cover Image

X-RAY ROCKING CURVE ANALYSIS OF S-IMPLANTED GaAs

Author(s):
Publication title:
Advanced surface processes for optoelectronics : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
126
Pub. Year:
1988
Page(from):
93
Page(to):
96
Pages:
4
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837968 [0931837960]
Language:
English
Call no.:
M23500/126
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings X-RAY DIFFRACTION ANALYSIS OF Au/Ni MULTILAYERS

Chaudhuri, J., Shah, S., Jankowski, A.F.

Materials Research Society
7 Conference Proceedings Relaxation Mechanisms of Strained SiGe Films Bonded to High and Low Viscosity Oxides

Hobart, K.D., Kub, F.J., Fatemi, M., Twigg, M.E., Thompson, P.E., Kuan, T.S., Inoki, C.K.

Electrochemical Society
2 Conference Proceedings ION IMPLANTATION IN InSb GROWN ON GaAs

Rao, M.V., Echard, R., Thompson, P.E., Berry, A.K., Mulpuri, S., Moore, F.G.

Materials Research Society
8 Conference Proceedings X-Ray Rocking Curve Characterization of SiC Substrates

M. Yoganathan, P. Wu, I. Zwieback

Trans Tech Publications
3 Conference Proceedings ANALYSIS OF STRAIN RELAXATION IN Au/Ni MULTILAYERS BY X-RAY DIFFRACTION

Chaudhuri, J., Gondhalekar, V., Shah, S., Jankowski, A.F.

Materials Research Society
9 Conference Proceedings POINT DEFECT EVOLUTION DURING RAPID THERMAL ANNEALING OF Si+-IMPLANTED GaAs

Levinson,. M, Armeinto, C. A., Shah, S. S. P.

Materials Research Society
4 Conference Proceedings X-RAY ANALYSIS OF Ni/Ti MULTILAYERS

Chaudhuri, J., Alyan, S. M., Jankowski, A. F.

MRS - Materials Research Society
10 Conference Proceedings DIGITAL X-RAY ROCKING CURVE TOPOGRAPHY

Anathanarayanan, T. S., Rosemier, R. G., Mayo, W. E., Dinan, J. H.

Materials Research Society
5 Conference Proceedings *MATERIALS ANALYSIS WITH X-RAY ROCKING CURVES

Paine, B.M.

Materials Research Society
11 Technical Paper Analysis of Strain Relaxation in Au/Ni Multilayers by X-Ray Diffraction

Chaudhuri, J., Gondhalekar, V., Shah, S., Jankowski, A.F.

National Aeronautics and Space Adminstration
6 Conference Proceedings HETEROSTRUCTURES OF GaAs AND AlAs ON SILICON: X-RAY ANALYSIS AND EXCIMER LASER ANNEALING

Georgakilas, A., Fatemi, M., Fotiadis, L., Christou, A.

Materials Research Society
12 Conference Proceedings X-RAY DOUBLE CRYSTAL ANALYSIS OF STRUCTURE AND STRESS RELAXATION IN SOLID PHASE EPITAXIAL CaF2 AND Ge/CaF2 FILMS ON (111) Si BY IN SITU RAPID ISOTHERMAL …

Chaudhuri, J., Hashmi, F., Singh, R., Thakur, R. P. S.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12