Zou, X., Avedesian, M. M., Heiningen, A. R. P. van.
American Institute of Chemical Engineers
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Figueiredo L. J., Berbardo A. C., Orfao M. J. J.
Martinus Nijhoff Publishers
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Sean T. Connolly, Albert Co, Edgardo Schwiderke, Adriaan van Heiningen
American Institute of Chemical Engineers
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J.S. Kim, J.H. Baek, M.H. Kim, S.S. Hong, M.S. Lee
Trans Tech Publications
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Liu, Y., Xue, J., Liu, X., Hou, R., Li, S.
Elsevier
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Highfield, J. G., Ruterana, P., Thampi, K. R., Graetzel, M.
Elsevier
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J. Li, X.Z. Zhang, P. Wang, G.W. Liu, H.C. Shao, G.J. Qiao
Trans Tech Publications
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Capani, P.M., Matz, P.D., Mueller, D.W., Kim, M.J., Walter, E.R., Rhoad, J.T., Busch, E.L., Reidy, R.F.
Materials Research Society
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Vanderwiel, D.P, Tonkovich, A.Y., Marco, J.L., Wegeng, R.S., Wang, Y.
American Institute of Chemical Engineers
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Sang-Wook Park, Jae-Wook Lee
Elsevier
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Aparicio, P. Ferreira, Garcia, M. Fernandez, Ramos, I. Rodriguez, Ruiz, A. Guerrero
Elsevier
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Maciuc,F.C., Stere,C.I., Sterian,A.R.P.
SPIE-The International Society for Optical Engineering
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