Blank Cover Image

*ENDOR SPECTROSCOPY ON DEEP LEVEL DEFECTS IN GaAs

Author(s):
Publication title:
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
104
Pub. date:
1988
Page(from):
363
Page(to):
374
Pages:
12
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837722 [0931837723]
Language:
English
Call no.:
M23500/104
Type:
Conference Proceedings

Similar Items:

Spaeth, J> M., Hofmann, D. M., Meyer, B. K.

Materials Research Society

Krambrock,K., Spaeth,J.-M.

Trans Tech Publications

HOFMANN,D.M., SPAETH,J.-M., MAYER,B.K.

Trans Tech Publications

Roos,G., Schbner,A., Pensl,G., Krambrock,K., Meyer,B.K., Spaeth,J.-M., Wagner,J.

Trans Tech Publications

Hofmann,D.M., Meyer,B.K., Pawlik,T., Alteheld,P., Spaeth,J.-M.

Trans Tech Publications

Lisker, M., Krtschil, A., Witte, H., Christen, J., As, D. J., Schottker, B., Lischka, K.

MRS - Materials Research Society

Krambrock,K., Meyer,B.K., Spaeth,J.-M.

Trans Tech Publications

KrTschil, A., Witte, H., Lisker, M., Christen, J., Birkle, U., Einfeldt, S., Hommel, D., Topf, M., Meyer, B. K.

MRS - Materials Research Society

Scott,M.B., Scofield,J.D., Yeo,Y.K., Hengehold,R.L.

Trans Tech Publications

Peaker,A.R., Dobaczewski,L., Andersen,O., Rubaldo,L., Hawkins,I.D., Nielsen,K.Bonde, Evans-Freeman,J.H.

Electrochemical Society, SPIE-The International Society for Optical Engineering

Eiche, C., Fiederle, M., Weese, J., Maier, D., Ebling, D., Ludwig, J., Benz, K. W.

MRS - Materials Research Society

Peaker, A.R., Dobaczewski, L., Andersen, O., Rubaldo, L., Hawkins, I.D., Bonde Nielsen, K., Evans-Freeman, J.H.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12