BAND OFFSETS AT STRAINED-LAYER INTERFACES

BAND OFFSETS AT STRAINED-LAYER INTERFACES

Author(s):: Van de Walle, Chris G.
Publication title:: Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.
Title of ser.:: Materials Research Society symposium proceedings
Ser. no.:: 102
Pub. Year:: 1988
Page(from):: 565
Page(to):: 570
Pages:: 6
Pub. info.:: Pittsburgh, Pa.: Materials Research Society
ISSN:: 02729172
ISBN:: 9780931837708 [0931837707]
Language:: English
Call no.:: M23500/102
Type:: Conference Proceedings

Details

TDL ID:	ZA00015588
Series ID:	PA00000011
Conf. info. (Name):	Symposium on epitaxy of semiconductor layered structures
Conf. info. (Number):	1987
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1987.11.30-1987.12.04

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