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INVESTIGATIONS OF MICROSTRUCTURAL CHANGES IN NICKEL THIN FILMS ON ION-IMPLANTED SILICON BY CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY WITH INTERMITTENT ANNEALINGS IN N2 AMBIENT

Author(s):
Publication title:
Initial stages of epitaxial growth : symposium held April 22-24, 1987, Anaheim, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
94
Pub. Year:
1987
Page(from):
293
Page(to):
298
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837616 [0931837618]
Language:
English
Call no.:
M23500/94
Type:
Conference Proceedings

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