Blank Cover Image

CHARACTERIZATION OF GaAs AND Ge FILMS ON (100) SILICON

Author(s):
Baribeau, J. _M.
Houghton, D. C.
Maigne, P.
Moore, W. T.
Devine, R. L. S.
Denhoff, M. W.
Stoner, R. J.
McCaffrey, J.
Jackman, T. E.
4 more
Publication title:
Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
91
Pub. Year:
1987
Page(from):
175
Page(to):
180
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837586 [0931837588]
Language:
English
Call no.:
M23500/91
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings CHARACTERIZATION OF Si MBE LAYERS DOPED IN SITU BY As ION BEAMS

Swanson, Max L., Parikh, N. R., Jackman, T. E., Houghton, D. C., Denhoff, M. W.

Materials Research Society
7 Conference Proceedings STRUCTURAL DEFECTS IN PARTIALLY RELAXED InGaAs LAYERS

Maigne, P., Baribeau, J. -M., Roth, A. P., Boon, C. L.

MRS - Materials Research Society
2 Conference Proceedings Ge AND GeSi HETEROEPITAXY ON Si(100) BY MBE

Houghton, D.C., Bariebeau, J.-M., Maigne, P., Jackman, T.E., Bassignana, I.C., Tan, C.C., Holt., R.

Materials Research Society
8 Conference Proceedings ELECTRICAL AND OPTICAL PROPERTIES OF ERBIUM IN MBE SILICON AND Si/Ge ALLOYS

Efeoglu, H., Evans, J.H., Langer, J.M., Peaker, A.R., Rowell, N.L., Noel, J.-P., Perovic, D.D., Jackman, T.E., Houghton, …

Materials Research Society
3 Conference Proceedings Ge GaAs AND inSBHETEROEPITAXY ON ( 100 ) Si

Houghton.C.D., Baribeau M. J., Jackman E. T., Caffrey Mc J., Rao Sudersena T., Webb B. J., Perovic D., Weatherly C. G., …

Kluwer Academic Publishers
9 Conference Proceedings Structural and Electrical Characterization of Nanocrystalline Silicon Super- lattices

Groin, L.Tsybeskov; G.F., Fauchet, P.M., McCaffrey, J.P., Baribeau J.-M., Labbe, H.J., Sproule, G.I., Lockwood, D.J.

Electrochemical Society
4 Conference Proceedings RBS/CHANNELING AND TEN ANALYSIS OF THIN SANDWICHED EPI-LAYERS OF GERMANIUM ON SILICON

Swanson, M.L., Parikh, N.P., Frey, E.C., Sandhu, G.S., Chu, W.K., Baribeau, J.-M., Song, Kechang, McCaffrey, J., …

Materials Research Society
10 Conference Proceedings THE KINETICS OF Si1-xGexSi RELAXATION USING LARGE AREA DISLOCATION IMAGING TECHNIQUES

Houghton, D.C., Timbrell, P.Y., Baribeau, J.-M.

Materials Research Society
5 Conference Proceedings *Optical and microstructural characterization of nanocrystalline silicon superlattices

Tsybeskov, L., Grom, G. F., Krishnan, R., Fauchet, P. M., McCaffrey, J. P., Baribeau, J-M., Sproule, G. I., Lockwood, D. …

MRS-Materials Research Society
11 Conference Proceedings INTERFACE STRUCTURE OF Ge/Si SUPERLATTICES DETERMINED BY X-RAY ABSORPTION FINE STRUCTURE

Aebi, P., Tyliszczak, T., Hitchcock, A.P., Baribeau, J.-M., Lockwood, D.L., Jackman, T.E.

Materials Research Society
6 Conference Proceedings GROWTH AND CHARACTERISATION OF Si/Ge MULTILAYER STRUCTURES ON Si ( 100 )

Baribeau M. J., Lockwood L. D., Wardana - Dharma C. W. M., Aers C. G., Houghton C. D.

Kluwer Academic Publishers
12 Conference Proceedings MICROSTRUCTURAL CHARACTERIZATION OF GaAs SUBSTRATES

Moore, T.M., Matteson, S., Duncan, W.M., Matyi, R.J.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12