CHARACTERIZATION OF SURFACE ROUGHNESS IN THIN FILMS AND SMALL PARTICLES

CHARACTERIZATION OF SURFACE ROUGHNESS IN THIN FILMS AND SMALL PARTICLES

Author(s):

Silva, R.

Publication title:

Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

82

Pub. Year:

1987

Page(from):

475

Page(to):

480

Pages:

6

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837470 [0931837472]

Language:

English

Call no.:

M23500/82

Type:

Conference Proceedings

Details

TDL ID:	ZA00015568
Series ID:	PA00000011
Conf. info. (Name):	Symposium on characterization of defects in materials
Conf. info. (Number):	1986
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1986.12.01-1986.12.02

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