*CHARACTERIZATION OF DEFECT STRUCTURES BY PERTURBED ANGULAR CORRELATION TECHNIQUE

*CHARACTERIZATION OF DEFECT STRUCTURES BY PERTURBED ANGULAR CORRELATION TECHNIQUE

Author(s):: Wichert, Thomas
Publication title:: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.
Title of ser.:: Materials Research Society symposium proceedings
Ser. no.:: 82
Pub. Year:: 1987
Page(from):: 35
Page(to):: 52
Pages:: 18
Pub. info.:: Pittsburgh, Pa.: Materials Research Society
ISSN:: 02729172
ISBN:: 9780931837470 [0931837472]
Language:: English
Call no.:: M23500/82
Type:: Conference Proceedings

Details

TDL ID:	ZA00015568
Series ID:	PA00000011
Conf. info. (Name):	Symposium on characterization of defects in materials
Conf. info. (Number):	1986
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1986.12.01-1986.12.02

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