Blank Cover Image

ORIENTATIONS OF ULTRATHIN NiSi2 LAYERS ON Si

Author(s):
Tung, R.T.  
Publication title:
Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
77
Pub. Year:
1987
Page(from):
259
Page(to):
264
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837562 [0931837561]
Language:
English
Call no.:
M23500/77
Type:
Conference Proceedings

Similar Items:

Tung, R.T., Schrey, F.

Materials Research Society

Yalisove, S.M., Tung, R.T., Batstone, J.L.

Materials Research Society

Sullivan, J.P., Tung, R.T., Schrey, F., Graham, W.R.

Materials Research Society

Hensel, J. C., Tung, R. T., Poate, J. M., Unterwald, F. C., Jacobson, D. C.

North-Holland

Tung, R. T., Ohmi, S.

MRS - Materials Research Society

Tung, R. T., Sullivan, J. P., Schrey, F., Levi, A. F. J.

Materials Research Society

Tung, R.T., Eaglesham, D.J., Schrey, F., Sullivan, J.P.

Materials Research Society

Tung, R.T., Gibson, J.M.

Materials Research Society

5 Conference Proceedings Epitaxial NiSi2 and CoSi2 Interfaces

Tung T. R., Levi J. F. A., Schrey F., Anzlowar M.

Plenum Press

Teng, R. T., Gibson, J. M., Poate, J. M.

North-Holland

Tung, R. T., Batstone, J. L., Yalisove, S. M.

Materials Research Society

Ohmi, S., Tung, R. T.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12