ORIGIN OF SUBBOUNDARY FORMATION IN ENCAPSULATED RECRYSTALLIZED Si FILMS ON SiO2
- Author(s):
- Publication title:
- Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 74
- Pub. Year:
- 1987
- Page(from):
- 571
- Page(to):
- 576
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837401 [0931837405]
- Language:
- English
- Call no.:
- M23500/74
- Type:
- Conference Proceedings
Similar Items:
North-Holland |
7
Conference Proceedings
* THERMAL STRESS DURING ZONE-MELTING-RECRYSTALLIZATION OF SILICON ON INSULATOR FILMS: THE ORIGIN OF SUBBOUNDARIES AND IN-PLANE ORIENTATION OF SOI
Materials Research Society |
North-Holland |
8
Conference Proceedings
Photofunctions of Dye Encapsulated Nanostructured Silica Films Suitable for Optical Filter Application
Trans Tech Publications |
3
Conference Proceedings
On the Origin of Visible Luminescence from SiO2 Films Containing Ge Nanocrystals
MRS - Materials Research Society |
Materials Research Society |
4
Conference Proceedings
*ELECTRICAL CHARACTERISTICS AND DEVICE APPLICATIONS OF ZONE-MELTING-RECRYSTALLIZED Si FILMS ON SiO2
North-Holland |
North-Holland |
5
Conference Proceedings
ELIMINATION OF SUBBOUNDARIES FROM ZONE-MELTING-RECRYSTALLIZED SILICON-ON-INSULATOR FILMS
Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |