Blank Cover Image

CHARACTERIZATION OF THIN FILM DIELECTRICS BY FTIRS

Author(s):
Cox, J.N.  
Publication title:
Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
69
Pub. Year:
1986
Page(from):
219
Page(to):
224
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837357 [0931837359]
Language:
English
Call no.:
M23500/69
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Silanol In CVD Thin Films

Cox, J.N.

Electrochemical Society

Butler, J.E., Koller, K.B., Schmidt, W.A.

Materials Research Society

Cox, J.N., Hwang, K., Kwok, K., Downing, R.G., Lamaze, G.

Electrochemical Society

Neal Cox, J., Rastogi, R.

Materials Research Society

Mineharu Tsukndn, J.S. Cross, M. Nishizawa, K. Kurihara, N. Kamehara

Society of Photo-optical Instrumentation Engineers

Cox, Neal J., Rastogi, R.

Materials Research Society

Cox, J.N., Hutchinson, J.M., Lee, K.K.D., Sheridan, B., Wong, R., Yang, I.-C.J.

Electrochemical Society

broughton, J.N., Breu, M.J.

Electrochemical Society

Zhang, S., Franke, J.E., Niemezyk, T.M., Haaland, D.M., Cox, J.N., Banerjee, I., Gee, J., Dang, T., Puich, M.

Electrochemical Society

Zaman, R.J., Damiano, J., Jr., Batra, S., Manning, M., Banerjee, S.K.

Electrochemical Society

Woollam, J.A., Bungay, C.L., Yan, L., Thompson, D.W., Hilfiker, J.N.

SPIE-The International Society for Optical Engineering

12 Conference Proceedings Polymeric Thin Film Optoelectronic Devices

Misra, S.C.K., Cruickshank, F.R., Sherwood, J.N.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12