OBSERVATION OF GaAS/ Si EPITAXIAL INTERFACES BY ATOMIC RESOLUTION ELECTRON MICROSCOPY
- Author(s):
Otsuka, N. Choi, C. Nakamura, Y Nagakura, S. Fischer, R. Peng, C.K. Morkoc, H. - Publication title:
- Heteroepitaxy on silicon : symposium held April 16-18, 1986, Palo Alto, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 67
- Pub. Year:
- 1986
- Page(from):
- 85
- Page(to):
- 92
- Pages:
- 8
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837333 [0931837332]
- Language:
- English
- Call no.:
- M23500/67
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
OBSERVATION OF THE CdTe-GaAs INTERFACE BY HIGH RESOLUTION ELECTRON MICROSCOPY
Materials Research Society |
Materials Research Society |
Materials Research Society |
8
Conference Proceedings
HIGH RESOLUTION ELECTRON MICROSCOPE STUDY OF CdTe - Cd0.6Mn0.4Te SUPERLATTICES
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
4
Conference Proceedings
HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERFACES IN TOPOTAXIAL AND EPITAXIAL REACTIONS
Materials Research Society |
Trans Tech Publications |
Materials Research Society |
Materials Research Society |
6
Conference Proceedings
HIGH RESOLUTION ELECTRON MICROSCOPY STUDIES OF MBE GROWN InSb LAYERS ON GaAs (100)
Materials Research Society |
North-Holland |